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https://ptsldigital.ukm.my/jspui/handle/123456789/433802| Title: | The application of built-in self test(BIST) for embedded memory testing via MBIST architect |
| Authors: | Nor Faridah Za'bah |
| Conference Name: | Proceedings of the 1st National Conference on Electronic Design |
| Keywords: | BIST MBIST Architect Built-in Self Test |
| Conference Date: | 2005 |
| Conference Location: | Putra Palace Hotel, Kangar |
| Call Number: | TK7867.N383 2005 kat |
| Publisher: | School of Computer and Communication Engineering,Kolej Universiti Kejuruteraan Utara Malaysia |
| URI: | https://ptsldigital.ukm.my/jspui/handle/123456789/433802 |
| Appears in Collections: | Seminar Papers/ Proceedings / Kertas Kerja Seminar/ Prosiding |
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