Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/433802
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dc.contributor.authorNor Faridah Za'bah-
dc.date.accessioned2023-08-04T09:30:39Z-
dc.date.available2023-08-04T09:30:39Z-
dc.identifier.otherukmvital:65287-
dc.identifier.urihttps://ptsldigital.ukm.my/jspui/handle/123456789/433802-
dc.language.isoen-
dc.publisherSchool of Computer and Communication Engineering,Kolej Universiti Kejuruteraan Utara Malaysia-
dc.subjectBIST-
dc.subjectMBIST Architect-
dc.subjectBuilt-in Self Test-
dc.titleThe application of built-in self test(BIST) for embedded memory testing via MBIST architect-
dc.typeSeminar Papers-
dc.identifier.callnoTK7867.N383 2005 kat-
dc.contributor.conferencenameProceedings of the 1st National Conference on Electronic Design-
dc.coverage.conferencelocationPutra Palace Hotel, Kangar-
dc.date.conferencedate2005-
Appears in Collections:Seminar Papers/ Proceedings / Kertas Kerja Seminar/ Prosiding

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