Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/587466
Title: Crystallinity and Si-H Bonding Configuration of nc-Si:H Films Grown by Layer-by-layer (LBL) Deposition Technique at Different RF Power
Authors: Goh Boon Tong
Saadah Abdul Rahman
Siti Meriam Ab. Gani
Keywords: Crystallite size
FTIR
nc-Si:H
XRD
Issue Date: 2008
News Source: Sains Malaysiana
ISSN: 0126-6039
Call Number: Siri Q1.S23
Publisher: Penerbit UKM
Appears in Collections:UKM Journal Article / Artikel Jurnal UKM

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.