Please use this identifier to cite or link to this item:
https://ptsldigital.ukm.my/jspui/handle/123456789/486887| Title: | VLSI circuit testing using probabilistic approach |
| Authors: | Ahmed Iftekhar |
| Supervisor: | Khalid Abdul Kadir |
| Keywords: | Integrated circuits - Large scale integrating VLSI circuit testing Probabilistic approach |
| Issue Date: | 1995 |
| Call Number: | TK7874.75.A45 1995 |
| Publisher: | UKM, Bangi |
| URI: | https://ptsldigital.ukm.my/jspui/handle/123456789/486887 |
| Appears in Collections: | Faculty of Engineering and Built Environment / Fakulti Kejuruteraan dan Alam Bina |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| ukmvital_295+Source+Source.0.PDF Restricted Access | 11.43 MB | Adobe PDF |  View/Open |
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