Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/395105
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dc.contributor.authorMohd Fo'ad Rohani-
dc.contributor.authorMohd Aizaini Maarof-
dc.contributor.authorAli Selamat-
dc.contributor.authorHoussain Kettani-
dc.date.accessioned2023-06-15T07:55:14Z-
dc.date.available2023-06-15T07:55:14Z-
dc.identifier.otherukmvital:122966-
dc.identifier.urihttps://ptsldigital.ukm.my/jspui/handle/123456789/395105-
dc.description.abstractThis paper analyzes Loss of Self-Similarity (LoSS) detection accuracy using parameter's adjustment which includes different values of sampling level and correlation lag. This is important when considering exact and asymptotic self-similar models concurrently in the sell: similarity parameter estimation method. Due to the needs of high accuracy and fast estimation, the Optimization Method (OM) based on Second Order Self-similarity (SOSS) statistical model was proposed in the previous works to estimate self-similarity parameter. Consequently, Curve Fitting Error (CFE) value estimated from OM is used to detect LOSS efficiently. This work investigates the effect of the parameter's adjustment for improving the CFE accuracy and estimation time speed. We have tested the the method with real Internet traffics simulation that consists of normal and malicious packets traffic. Our simulation results show that LOSS detection accuracy and estimation time can be affected by the chosen of sampling level and correlation lag values.-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE),Piscataway, US-
dc.subjectLoSS detection-
dc.subjectStatistical model-
dc.titleLoSS detection using parameters adjustment based on second order self-similarity statistical model-
dc.typeSeminar Papers-
dc.format.pages7-
dc.identifier.callnoT58.5.C634 2008 kat sem j.3-
dc.contributor.conferencenameInternational Symposium on Information Technology-
dc.coverage.conferencelocationKuala Lumpur Convention Centre-
dc.date.conferencedate26/08/2008-
Appears in Collections:Seminar Papers/ Proceedings / Kertas Kerja Seminar/ Prosiding

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