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PreviewIssue DateTitleAuthor(s)
ukmvital_475+Source+Source.0.PDF.jpg1999An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits.Altaf-ul-Amin Md
ukmvital_2885+ABSTRACT+ABSTRACT.0.PDF.jpg2002Reka bentuk litar pengesan arus bagi pengujian logik dan IDDQ secara serentakRobiah Sdidin; Fahmi Samsuri

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