Please use this identifier to cite or link to this item:
https://ptsldigital.ukm.my/jspui/handle/123456789/457589| Title: | An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits. |
| Authors: | Altaf-ul-Amin Md |
| Keywords: | Iddq testing Integrated circuits - Very large scale integration - Testing Metal oxide semiconductors Complementary - Testing |
| Issue Date: | 1999 |
| Call Number: | TK7874.75.A47 1999 |
| Publisher: | UKM, Bangi |
| Appears in Collections: | Faculty of Engineering and Built Environment / Fakulti Kejuruteraan dan Alam Bina |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| ukmvital_475+Source+Source.0.PDF Restricted Access | 6.11 MB | Adobe PDF |  View/Open |
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