Browsing by Author Nor Faridah Za'bah
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| Previews | Issue Date | Tahap Akses | Title | Author(s) |
|---|---|---|---|---|
| - | - | The application of built-in self test(BIST) for embedded memory testing via MBIST architect | Nor Faridah Za'bah; Proceedings of the 1st National Conference on Electronic Design |