Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/587270
Title: Electrical Characterization of Cross-linked ZnO Nanostructures Grown on Si and Si/SiO2 Substrate
Authors: B. Y. Majlis
C. F. Dee
M. Yahaya
Keywords: I-V measurement
Schottky contacts
ZnO nanostructures
Issue Date: 2008
News Source: Sains Malaysiana
ISSN: 0126-6039
Call Number: Siri Q1.S23
Publisher: Penerbit UKM
Appears in Collections:UKM Journal Article / Artikel Jurnal UKM

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