Please use this identifier to cite or link to this item:
https://ptsldigital.ukm.my/jspui/handle/123456789/587270
Title: | Electrical Characterization of Cross-linked ZnO Nanostructures Grown on Si and Si/SiO2 Substrate |
Authors: | B. Y. Majlis C. F. Dee M. Yahaya |
Keywords: | I-V measurement Schottky contacts ZnO nanostructures |
Issue Date: | 2008 |
News Source: | Sains Malaysiana |
ISSN: | 0126-6039 |
Call Number: | Siri Q1.S23 |
Publisher: | Penerbit UKM |
Appears in Collections: | UKM Journal Article / Artikel Jurnal UKM |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.