Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/587106
Full metadata record
DC FieldValueLanguage
dc.contributor.authorI. A. Talib-
dc.contributor.authorN. B. Ibrahim-
dc.contributor.authorR. Dewi-
dc.date.accessioned2023-11-06T08:51:07Z-
dc.date.available2023-11-06T08:51:07Z-
dc.date.issued2008-
dc.identifier.issn0126-6039-
dc.identifier.otherukmvital:12187-
dc.identifier.urihttps://ptsldigital.ukm.my//jspui/handle/123456789/587106-
dc.language.isoen-
dc.publisherPenerbit UKM-
dc.relation.haspartSains Malaysiana-
dc.relation.urihttp://journalarticle.ukm.my,http://www.ukm.my/jsm/-
dc.subjectBST thin films-
dc.subjectDielectric constant-
dc.subjectElectrical conductivity-
dc.subjectSol-gel process-
dc.titleEffect of annealing temperature on the microstructure and dielectric properties of Ba0.6Sr0.4TiO3 thin films prepared by sol-gel process-
dc.typeJournal Article-
dc.identifier.callnoSiri Q1.S23-
Appears in Collections:UKM Journal Article / Artikel Jurnal UKM

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.