Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/586680
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dc.contributor.authorAzman Jalar-
dc.contributor.authorMuhammad Azmi Abdul Hamid-
dc.contributor.authorNorliza Ismail-
dc.date.accessioned2023-11-06T08:42:22Z-
dc.date.available2023-11-06T08:42:22Z-
dc.date.issued2009-
dc.identifier.issn0126-6039-
dc.identifier.otherukmvital:11859-
dc.identifier.urihttps://ptsldigital.ukm.my//jspui/handle/123456789/586680-
dc.language.isoen-
dc.publisherPenerbit UKM-
dc.relation.haspartSains Malaysiana-
dc.relation.urihttp://journalarticle.ukm.my,http://www.ukm.my/jsm/-
dc.subjectFilem nipis Au-In-
dc.subjectmikrostruktur-
dc.subjectpenyejatan alur elekron-
dc.subjectTEM-
dc.subjectXPS-
dc.titleMicrostructural Characterization of Au-In Thin Film Deposited by Electron Beam Evaporation-
dc.typeJournal Article-
dc.identifier.callnoSiri Q1.S23-
Appears in Collections:UKM Journal Article / Artikel Jurnal UKM

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