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Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/486887
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dc.contributor.advisorKhalid Abdul Kadir
dc.contributor.authorAhmed Iftekhar
dc.date.accessioned2023-10-11T02:26:16Z-
dc.date.available2023-10-11T02:26:16Z-
dc.date.issued1995
dc.identifier.otherukmvital:295
dc.identifier.urihttps://ptsldigital.ukm.my/jspui/handle/123456789/486887-
dc.language.isoeng
dc.publisherUKM, Bangi
dc.relationFaculty of Engineering and Built Environment / Fakulti Kejuruteraan dan Alam Bina
dc.rightsUKM
dc.subjectIntegrated circuits - Large scale integrating
dc.subjectVLSI circuit testing
dc.subjectProbabilistic approach
dc.titleVLSI circuit testing using probabilistic approach
dc.typeTheses
dc.identifier.callnoTK7874.75.A45 1995
Appears in Collections:Faculty of Engineering and Built Environment / Fakulti Kejuruteraan dan Alam Bina

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