An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits.

Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/457589

Full metadata record

DC Field	Value	Language
dc.contributor.author	Altaf-ul-Amin Md
dc.date.accessioned	2023-09-12T09:11:14Z	-
dc.date.available	2023-09-12T09:11:14Z	-
dc.date.issued	1999
dc.identifier.other	ukmvital:475
dc.identifier.uri	https://ptsldigital.ukm.my/jspui/handle/123456789/457589	-
dc.language.iso	eng
dc.publisher	UKM, Bangi
dc.relation	Faculty of Engineering and Built Environment / Fakulti Kejuruteraan dan Alam Bina
dc.rights	UKM
dc.subject	Iddq testing
dc.subject	Integrated circuits - Very large scale integration - Testing
dc.subject	Metal oxide semiconductors
dc.subject	Complementary - Testing
dc.title	An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits.
dc.type	theses
dc.identifier.callno	TK7874.75.A47 1999
Appears in Collections:	Faculty of Engineering and Built Environment / Fakulti Kejuruteraan dan Alam Bina

Files in This Item:

File	Description	Size	Format
ukmvital_475+Source+Source.0.PDF Restricted Access		6.11 MB	Adobe PDF	View/Open