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Previews	Issue Date	Tahap Akses	Title	Author(s)
	Jan-2017	UKM	A study of negative bias temperature instability (nbti) in p-mosfet devices	H. Hussin (UITM); M. F. Zainudin (UITM)
	Jan-2017	UKM	A study of negative bias temperature instability (nbti) in p-mosfet devices	H. Hussin (UITM); M. F. Zainudin (UITM)

Showing results 1 to 2 of 2