Please use this identifier to cite or link to this item: https://ptsldigital.ukm.my/jspui/handle/123456789/587317
Title: Microstructural Characterization of Au-In Thin Film Deposited by Electron Beam Evaporation
Authors: Azman Jalar
Muhammad Azmi Abdul Hamid
Norliza Ismail
Keywords: Au-In thin film
e-beam evaporation
microstructure
TEM
XPS
Issue Date: 2009
News Source: Sains Malaysiana
ISSN: 0126-6039
Call Number: Siri Q1.S23
Publisher: Penerbit UKM
Appears in Collections:UKM Journal Article / Artikel Jurnal UKM

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