Please use this identifier to cite or link to this item:
https://ptsldigital.ukm.my/jspui/handle/123456789/587270| Title: | Electrical Characterization of Cross-linked ZnO Nanostructures Grown on Si and Si/SiO2 Substrate |
| Authors: | B. Y. Majlis C. F. Dee M. Yahaya |
| Keywords: | I-V measurement Schottky contacts ZnO nanostructures |
| Issue Date: | 2008 |
| News Source: | Sains Malaysiana |
| ISSN: | 0126-6039 |
| Call Number: | Siri Q1.S23 |
| Publisher: | Penerbit UKM |
| URI: | https://ptsldigital.ukm.my//jspui/handle/123456789/587270 |
| Appears in Collections: | UKM Journal Article / Artikel Jurnal UKM |
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